GENEVA, Sept. 1 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/050439) for "CONDITION BASED L1 MEASUREMENT AND REPORTING" on Jan 09, 2025. With publication no. WO/2025/176375, the details related to the patent application was published on Aug 28, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): ZHANG, Xin (Nokia Solutions and Networks GmbH & Co. KGWerinherstrasse 9181541 Munich), BAZZI, Samer (Nokia Solutions and Networks GmbH & Co. KGWerinherstrasse 9181541 Munich), GURSU, Halit Murat (Nokia Solutions and Networks GmbH & Co. KGWerinherstrasse 9181541...