GENEVA, Oct. 4 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/052545) for "CELL SELECTION MEASUREMENTS OF CELL IN SSB-LESS MODE" on Jan 31, 2025. With publication no. WO/2025/201701, the details related to the patent application was published on Oct 02, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): HATHIRAMANI, Navin (3201 Olympus BoulevardDallas, Texas 75019), RANTA-AHO, Karri Markus (Karakaari 1302610 Espoo)
Abstract: Disclosed is a method comprising determining a first measurement configuration indicating a first set of signals for measuring a ...