GENEVA, Feb. 2 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/IB2025/057030) for "BEAM QUALITY METRIC BASED ON GRAM MATRIX" on Jul 10, 2025. With publication no. WO/2026/022597, the details related to the patent application was published on Jan 29, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): MEDINA, Daniel (Werinherstrasse 9181541 Munich), BARACCA, Paolo (Werinherstrasse 9181541 Munich), BAZZI, Samer (Werinherstrasse 9181541 Munich)
Abstract: Example embodiments of the disclosure relate to methods, apparatuses, and computer readable storage medium for ...