INTERNATIONAL PATENT: NIKON SLM SOLUTIONS AG FILES APPLICATION FOR "METHOD FOR MEASURING AN ADDITIVE MANUFACTURING APPARATUS, MEASURING SYSTEM FOR AN ADDITIVE MANUFACTURING APPARATUS AND ADDITIVE MANUFACTURING APPARATUS"

GENEVA, Sept. 8 -- NIKON SLM SOLUTIONS AG (Estlandring 423560 Luebeck) filed a patent application (PCT/EP2025/051454) for "METHOD FOR MEASURING AN ADDITIVE MANUFACTURING APPARATUS, MEASURING SYSTEM FOR AN ADDITIVE MANUFACTURING APPARATUS, AND ADDITIVE MANUFACTURING APPARATUS" on Jan 22, 2025. With publication no. WO/2025/180721, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NEUMANN, Karsten (c/o Nikon SLM Solutions AGEstlandring 423560 Luebeck), PAVLITA, Jan (c/o Nikon SLM Solutions AGEstlandring 423560 Luebeck), BARZ, ...