INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "POSITION DETECTION METHOD, POSITION DETECTION SYSTEM AND EXPOSURE DEVICE"

GENEVA, Nov. 18 -- NIKON CORPORATION (1-5-20, Nishioi, Shinagawa-ku, Tokyo1408601), 株式会社ニコン (東京都品川区西大井１－５－２０) filed a patent application (PCT/JP2025/005843) for "POSITION DETECTION METHOD, POSITION DETECTION SYSTEM, AND EXPOSURE DEVICE" on Feb 20, 2025. With publication no. WO/2025/234192, the details related to the patent application was published on Nov 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YAJIMA, Kaito (c/o NIKON CORPORATI...