INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "MARK MEASUREMENT METHOD, MEASUREMENT DEVICE, EXPOSURE DEVICE, CALCULATION DEVICE, PROGRAM AND RECORDING MEDIUM"

GENEVA, Oct. 4 -- NIKON CORPORATION (15-3, Konan 2-chome, Minato-ku, Tokyo1086290), 株式会社ニコン (東京都港区港南二丁目１５番３号) filed a patent application (PCT/JP2024/012904) for "MARK MEASUREMENT METHOD, MEASUREMENT DEVICE, EXPOSURE DEVICE, CALCULATION DEVICE, PROGRAM, AND RECORDING MEDIUM" on Mar 28, 2024. With publication no. WO/2025/203521, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(...