INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "CONTROL SYSTEM, DISPLAY SYSTEM, MEASUREMENT SYSTEM, STRUCTURE MANUFACTURING METHOD, STRUCTURE MANUFACTURING SYSTEM, CONTROL METHOD AND PROGRAM"

GENEVA, Nov. 24 -- NIKON CORPORATION (15-3, Konan 2-chome, Minato-ku, Tokyo1086290), 株式会社ニコン (東京都港区港南二丁目１５番３号) filed a patent application (PCT/JP2024/017824) for "CONTROL SYSTEM, DISPLAY SYSTEM, MEASUREMENT SYSTEM, STRUCTURE MANUFACTURING METHOD, STRUCTURE MANUFACTURING SYSTEM, CONTROL METHOD, AND PROGRAM" on May 14, 2024. With publication no. WO/2025/238717, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Propert...