INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "BEAM SCANNING DEVICE, PROCESSING DEVICE AND PROCESSING METHOD"

GENEVA, Sept. 9 -- NIKON CORPORATION (15-3, Konan 2-chome, Minato-ku, Tokyo1086290), 株式会社ニコン (東京都港区港南二丁目１５番３号) filed a patent application (PCT/JP2024/007314) for "BEAM SCANNING DEVICE, PROCESSING DEVICE, AND PROCESSING METHOD" on Feb 28, 2024. With publication no. WO/2025/181942, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KAWABE, Yoshio (c/o NIKON CORPORATION, 15-3,...