INTERNATIONAL PATENT: NEXPERIA B.V. FILES APPLICATION FOR "DETECTING DEFECTS IN SEMICONDUCTOR DEVICES BASED ON IMAGES OF SAID SEMICONDUCTOR DEVICES IN AN INSPECTION PROCESS"

GENEVA, Dec. 8 -- NEXPERIA B.V. (Jonkerbosplein 526534 AB Nijmegen) filed a patent application (PCT/EP2024/065092) for "DETECTING DEFECTS IN SEMICONDUCTOR DEVICES BASED ON IMAGES OF SAID SEMICONDUCTOR DEVICES IN AN INSPECTION PROCESS" on May 31, 2024. With publication no. WO/2025/247505, the details related to the patent application was published on Dec 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHIN, Chung Wei (Nijmegen), WONG, Kin Man (Hong Kong), LEUNG, Chi To (Hong Kong), CHUI, Tak Kei (Hong Kong)

Abstract: An inspection process for detecting one or more defects in a source ima...