INTERNATIONAL PATENT: NEW YORK UNIVERSITY FILES APPLICATION FOR "METHOD AND SYSTEM OF USING BIOMARKERS FOR XENOGRAFT DAMAGE OR REJECTION"

GENEVA, Oct. 28 -- NEW YORK UNIVERSITY (70 Washington Square SouthNew York, NY 10012) filed a patent application (PCT/US2025/024809) for "METHOD AND SYSTEM OF USING BIOMARKERS FOR XENOGRAFT DAMAGE OR REJECTION" on Apr 15, 2025. With publication no. WO/2025/221816, the details related to the patent application was published on Oct 23, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KEATING, Brendan (c/o New York University70 Washington Square SouthNew York, NY 10012), MONTGOMERY, Robert, A. (c/o New York University70 Washington Square SouthNew York, NY 10012), BOEKE, Jef (c/o New York Univers...