INTERNATIONAL PATENT: NEW YORK UNIVERSITY FILES APPLICATION FOR "DATA-DRIVEN 3D SCANNING"

GENEVA, Aug. 6 -- NEW YORK UNIVERSITY (70 Washington Square SouthNew York, New York 10012) filed a patent application (PCT/US2025/012626) for "DATA-DRIVEN 3D SCANNING" on Jan 22, 2025. With publication no. WO/2025/160199, the details related to the patent application was published on Jul 31, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PIADYK, Yurii (30 Newport PkwyApt 805Jersey City, New Jersey 07310), PANOZZO, Daniele (3 Washington Square VillageNew York, New York 10012), SILVA, Claudio (120 W 15th StApt 3GNew York, New York 10011)

Abstract: Systems and methods for structured light s...