INTERNATIONAL PATENT: NEW SILICON CORPORATION PTE LTD. FILES APPLICATION FOR "METHOD AND SYSTEM FOR VALIDATING A PHYSICAL LAYOUT OF A CIRCUIT FOR ELECTRONIC DESIGN AUTOMATION"

GENEVA, July 9 -- NEW SILICON CORPORATION PTE LTD. (71 Ayer Rajah Crescent,#03-26Singapore 139951) filed a patent application (PCT/SG2024/050837) for "METHOD AND SYSTEM FOR VALIDATING A PHYSICAL LAYOUT OF A CIRCUIT FOR ELECTRONIC DESIGN AUTOMATION" on Dec 27, 2024. With publication no. WO/2025/144105, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHIAH, Siau Ben (c/o New Silicon Corporation Pte Ltd.,71 Ayer Rajah Crescent,#03-26Singapore 139951), LEPKOWSKI, Daniel Leon (c/o New Silicon Corporation Pte Ltd.,71 Ayer Rajah...