INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "SYSTEM ENABLEMENT BASED ON IMAGE QUALITY ANALYSIS"

GENEVA, April 16 -- NEC LABORATORIES AMERICA, INC. (4 Independence WaySuite 200Princeton, New Jersey 08540) filed a patent application (PCT/US2024/047184) for "SYSTEM ENABLEMENT BASED ON IMAGE QUALITY ANALYSIS" on Sep 18, 2024. With publication no. WO/2025/075778, the details related to the patent application was published on Apr 10, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GARG, Sparsh (39469 Gallaudet DriveFremont, California 94538), SCHULTER, Samuel (5241 Center BoulevardLong Island City, New York 11101), SUH, Yumin (3405 Montgomery DriveSanta Clara, California 95054)

Abstract: ...