INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "SEQUENTIAL EVENT MODELING FROM MULTIVARIATE CATEGORICAL SENSOR DATA"

GENEVA, April 30 -- NEC LABORATORIES AMERICA, INC. (4 Independence WaySuite 200PRINCETON, New Jersey 08540) filed a patent application (PCT/US2024/046142) for "SEQUENTIAL EVENT MODELING FROM MULTIVARIATE CATEGORICAL SENSOR DATA" on Sep 11, 2024. With publication no. WO/2025/085185, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YUAN, Peng (46 Sycamore DrivePlainsboro, New Jersey 08536), TANG, LuAn (17 Shady Brook LaneCranbury, New Jersey 08512), CHEN, Haifeng (11 Blackhawk CourtWest Windsor, New Jersey 08550)

Abstract: ...