INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "SEQUENTIAL EVENT MODELING FOR RISK FACTOR PREDICTION"

GENEVA, April 29 -- NEC LABORATORIES AMERICA, INC. (4 Independence WaySuite 200Princeton, New Jersey 08540) filed a patent application (PCT/US2024/021982) for "SEQUENTIAL EVENT MODELING FOR RISK FACTOR PREDICTION" on Mar 28, 2024. With publication no. WO/2025/085102, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TANG, LuAn (17 Shady Brook LaneCranbury, New Jersey 08512), YUAN, Peng (15 Hanover CourtPrinceton, New Jersey 08540), CHEN, Haifeng (11 Blackhawk CourtWest Windsor, New Jersey 08550)

Abstract: Systems and met...