INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "GRADIENT-TO-PARAMETER RATIO GUIDED FEATURE ALIGNMENT FOR MODEL ADAPTATION"

GENEVA, May 19 -- NEC LABORATORIES AMERICA, INC. (4 Independence WaySuite 200Princeton, New Jersey 08540) filed a patent application (PCT/US2024/054876) for "GRADIENT-TO-PARAMETER RATIO GUIDED FEATURE ALIGNMENT FOR MODEL ADAPTATION" on Nov 07, 2024. With publication no. WO/2025/101718, the details related to the patent application was published on May 15, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): COSATTO, Eric (59 Ueland RoadRed Bank, New Jersey 07701), CHRONI, Evgenia Tatiani (288 Crowells RoadHighland Park, New Jersey 08904)

Abstract: Systems and methods for gradient-to-parameter ...