INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "3D GUNSHOT LOCALIZATION, TRACKING AND AI ENHANCED SYSTEM FOR SUBSTATION SECURITY"

GENEVA, May 19 -- NEC LABORATORIES AMERICA, INC. (Suite 2004 Independence WayPrinceton, New Jersey 08540) filed a patent application (PCT/US2024/054740) for "3D GUNSHOT LOCALIZATION, TRACKING, AND AI ENHANCED SYSTEM FOR SUBSTATION SECURITY" on Nov 06, 2024. With publication no. WO/2025/101619, the details related to the patent application was published on May 15, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DING, Yangmin (710 Village Drive SouthApt. BNorth Brunswick, New Jersey 08902), WANG, Ting (10 Glacier DriveWest Windsor, New Jersey 08550)

Abstract: Integrated DFOS systems and met...