GENEVA, March 25 -- NEARFIELD INSTRUMENTS B.V. (Vareseweg 53047 AT Rotterdam) filed a patent application (PCT/NL2024/050500) for "SCANNING PROBE MICROSCOPY SYSTEM" on Sep 13, 2024. With publication no. WO/2025/058518, the details related to the patent application was published on Mar 20, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): PISKUNOV, Taras (c/o Vareseweg 53047 AT Rotterdam), TABAK, Erik (c/o Vareseweg 53047 AT Rotterdam)
Abstract:
Scanning probe microscopy system comprising an optical microscope arranged to measure lateral coordinates of a target of the scanning probe microscop...