INTERNATIONAL PATENT: NEARFIELD INSTRUMENTS B.V. FILES APPLICATION FOR "METHOD OF PERFORMING FEATURE DETECTION OF IMAGE FEATURES, SCANNING PROBE MICROSCOPY SYSTEM AND MACHINE LEARNING MODEL."

GENEVA, Sept. 2 -- NEARFIELD INSTRUMENTS B.V. (Vareseweg 53047 AT Rotterdam) filed a patent application (PCT/NL2025/050084) for "METHOD OF PERFORMING FEATURE DETECTION OF IMAGE FEATURES, SCANNING PROBE MICROSCOPY SYSTEM AND MACHINE LEARNING MODEL." on Feb 21, 2025. With publication no. WO/2025/178491, the details related to the patent application was published on Aug 28, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GUO, Yan (c/o Vareseweg 53047 AT Rotterdam)

Abstract: The invention is directed at a method of performing feature detection of image features in an image obtained from a sca...