GENEVA, July 21 -- NEARFIELD INSTRUMENTS B.V. (Vareseweg 53047 AT Rotterdam) filed a patent application (PCT/NL2025/050011) for "METHOD FOR DETERMINING A PROBE TIP SHAPE" on Jan 08, 2025. With publication no. WO/2025/151029, the details related to the patent application was published on Jul 17, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): PAHLAVANI, Helda (c/o Vareseweg 53047 AT Rotterdam)
Abstract:
A method of determining a tip shape indication of a tip shape of a probe tip disposed on a probe of a scanning probe microscope mapping a surface, the method comprising steps of receiving m...