INTERNATIONAL PATENT: NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY, 国家纳米科学中心 FILES APPLICATION FOR "DETECTION METHOD AND DETECTION APPARATUS FOR ATOMIC-SCALE DEFECTS IN GALLIUM OXIDE CRYSTALS"

GENEVA, May 4 -- NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY (No.11 Zhongguancun, BeiyitiaoHaidian District, Beijing 100190), 国家纳米科学中心 (中国北京市海淀区中关村北一条11号) filed a patent application (PCT/CN2023/139990) for "DETECTION METHOD AND DETECTION APPARATUS FOR ATOMIC-SCALE DEFECTS IN GALLIUM OXIDE CRYSTALS" on Dec 19, 2023. With publication no. WO/2025/086440, the details related to the patent application was published on May 01, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Prope...