INTERNATIONAL PATENT: NAPSON CORPORATION, ナプソン株式会社 FILES APPLICATION FOR "METHOD FOR MEASURING RESISTIVITY OF SEMICONDUCTOR WAFER AND COMPUTER PROGRAM"

GENEVA, Dec. 16 -- NAPSON CORPORATION (2-36-12, Kameido, Koto-ku, Tokyo1360071), ナプソン株式会社 (東京都江東区亀戸２－３６－１２) filed a patent application (PCT/JP2025/016582) for "METHOD FOR MEASURING RESISTIVITY OF SEMICONDUCTOR WAFER, AND COMPUTER PROGRAM" on May 02, 2025. With publication no. WO/2025/253824, the details related to the patent application was published on Dec 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NAKANO, Taiga (c/o NAPSON...