INTERNATIONAL PATENT: NANOTRONICS IMAGING, INC. FILES APPLICATION FOR "FLUORESCENCE MICROSCOPY INSPECTION SYSTEMS, APPARATUS AND METHODS"

GENEVA, July 10 -- NANOTRONICS IMAGING, INC. (2251 Front Street, Suite 110Cuyahoga Falls, OH 44223) filed a patent application (PCT/US2024/061092) for "FLUORESCENCE MICROSCOPY INSPECTION SYSTEMS, APPARATUS AND METHODS" on Dec 19, 2024. With publication no. WO/2025/144684, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PUTMAN, John, B. (2251 Front Street, Suite 110Cuyahoga Falls, OH 44223), LEE, Joanna (2251 Front Street, Suite 110Cuyahoga Falls, OH 44223), BORDELANNE, Valerie (2251 Front Street, Suite 110Cuyahoga Falls, ...