INTERNATIONAL PATENT: NANO ANALYTIK GMBH, NEXENSOR INC. FILES APPLICATION FOR "THREE-DIMENTIONAL SHAPE MEASUREMENT SYSTEM AND CORRELATIVE MEASUREMENT METHOD USING INTERFEROMETER AND ATOMIC FORCE MICROSCOPE"

GENEVA, Sept. 21 -- NANO ANALYTIK GMBH (EhrenbergstraBe 398693 Ilmenau), NEXENSOR INC. (70, Yuseong-daero 1689 beon-gilYuseong-guDaejeon 34047) filed a patent application (PCT/EP2025/054499) for "THREE-DIMENTIONAL SHAPE MEASUREMENT SYSTEM AND CORRELATIVE MEASUREMENT METHOD USING INTERFEROMETER AND ATOMIC FORCE MICROSCOPE" on Feb 19, 2025. With publication no. WO/2025/190625, the details related to the patent application was published on Sep 18, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RANGELOW, Ivo (c/o nano analytik GmbHEhrenbergstraBe 398693 Ilmenau), JOONHO, You (c/o neXensor Inc.7...