INTERNATIONAL PATENT: MONSTR SENSE TECHNOLOGIES, LLC FILES APPLICATION FOR "WIDE BANDGAP SEMICONDUCTOR DEFECT CHARACTERIZATION BY UV FOUR-WAVE-MIXING IMAGING"

GENEVA, March 18 -- MONSTR SENSE TECHNOLOGIES, LLC (3830 Packard St. 150Ann Arbor, Michigan 48108) filed a patent application (PCT/US2024/045438) for "WIDE BANDGAP SEMICONDUCTOR DEFECT CHARACTERIZATION BY UV FOUR-WAVE-MIXING IMAGING" on Sep 05, 2024. With publication no. WO/2025/054364, the details related to the patent application was published on Mar 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MARTIN, Eric (3344 Clover DriveSaline, Michigan 48176), PURZ, Torben (3073 Signature Blvd, Apt. KAnn Arbor, Michigan 48103)

Abstract: An optical microscope includes a light source emitting...