INTERNATIONAL PATENT: MONA INC., 모나 주식회사 FILES APPLICATION FOR "EIS MEASUREMENT-BASED AI DIAGNOSTIC SYSTEM AND OPERATION METHOD THEREOF"

GENEVA, June 11 -- MONA INC. (Rm.2201, 6 Dongjangsan 2-gilGunsan-si,Jeonbuk-do 54158), 모나 주식회사 (전북특별자치도군산시동장산2길 6, 2201호) filed a patent application (PCT/KR2024/018576) for "EIS MEASUREMENT-BASED AI DIAGNOSTIC SYSTEM AND OPERATION METHOD THEREOF" on Nov 22, 2024. With publication no. WO/2025/116424, the details related to the patent application was published on Jun 05, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YOO, Yong Gi (111-1801, 41 Jije...