GENEVA, Jan. 5 -- MITUTOYO CORPORATION (20-1, Sakado 1-chomeTakatsu-ku, KawasakiKanagawa 213-8533) filed a patent application (PCT/IB2025/055436) for "METHOD AND DEVICE FOR DETERMINING A HEIGHT MAP" on May 27, 2025. With publication no. WO/2026/003609, the details related to the patent application was published on Jan 02, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): REDLARSKI, Lukasz (82, Welschapsedijk5652 XN Eindhoven)
Abstract: The current invention relates to a method for determining a height map of a sample surface of a sample. The invention further relates to a method for determini...