INTERNATIONAL PATENT: MITUTOYO CORPORATION FILES APPLICATION FOR "FLUCTUATION BASED METHOD FOR DETERMINING SUB-SURFACE DEFECTS OF A SAMPLE"

GENEVA, May 18 -- MITUTOYO CORPORATION (Kanagawa 213-8533) filed a patent application (PCT/IB2024/060959) for "FLUCTUATION BASED METHOD FOR DETERMINING SUB-SURFACE DEFECTS OF A SAMPLE" on Nov 06, 2024. With publication no. WO/2025/099584, the details related to the patent application was published on May 15, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MUKUNDAKUMAR, Balasubrahmaniyam (5627 AC Eindhoven), KUMAR, Nitish (5, Marter5508 MP Veldhoven)

Abstract: The invention relates to a method for sub-surface defect detection of a sample having a sample surface wherein use is made of an im...