GENEVA, Feb. 10 -- MITSUTEC, LTD. (134-1, Nakamura, Awaji-shi, Hyogo6561526), ミツテック株式会社 (兵庫県淡路市中村１３４番地の１) filed a patent application (PCT/JP2023/027873) for "INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM" on Jul 28, 2023. With publication no. WO/2025/027720, the details related to the patent application was published on Feb 06, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): NISHIDA Tetsuro (c/o MITSUTEC, LTD., 134-1, Naka...