INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "SELECTIVE USAGE OF CONCURRENT READ SCANS FOR READ DISTURB SCANNING"

GENEVA, Feb. 11 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716) filed a patent application (PCT/US2025/039508) for "SELECTIVE USAGE OF CONCURRENT READ SCANS FOR READ DISTURB SCANNING" on Jul 28, 2025. With publication no. WO/2026/030231, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZHANG, Daniel Danching (1639 Yosemite DriveMilpitas, California 95035), SLATTERY, John William (4890 Lee CircleBoulder, Colorado 80303), LIAO, Dongxiang (750 Haverhill DriveSunnyvale, California 94087)

Abstract: A syst...