INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "RECONSTRUCTED SEMICONDUCTOR DIE EVALUATION AND POWER DELIVERY"

GENEVA, Oct. 14 -- MICRON TECHNOLOGY, INC. (8000 S. Federal WayBoise, Idaho 83716-9632) filed a patent application (PCT/US2025/021526) for "RECONSTRUCTED SEMICONDUCTOR DIE EVALUATION AND POWER DELIVERY" on Mar 26, 2025. With publication no. WO/2025/212336, the details related to the patent application was published on Oct 09, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BHUSHAN, Bharat (8000 S. Federal WayBoise, Idaho 83716-9632), PAREKH, Kunal R. (8000 S. Federal WayBoise, Idaho 83716-9632), SINGH, Akshay N. (8000 S. Federal WayBoise, Idaho 83716-9632)

Abstract: Methods, systems, and de...