INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "MEMORY DEVICE AUTONOMOUS MEASUREMENT ATTESTATION"

GENEVA, March 18 -- MICRON TECHNOLOGY, INC. (8000 So. Federal WayBoise, Idaho 83716-9632) filed a patent application (PCT/US2024/040280) for "MEMORY DEVICE AUTONOMOUS MEASUREMENT ATTESTATION" on Jul 31, 2024. With publication no. WO/2025/053924, the details related to the patent application was published on Mar 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RUANE, James (1123 Bentoak Ct.San Jose, California 95129), ZANKOVICH, Artsiom (135 Ede LnMilpitas, California 95035)

Abstract: A processing device calculates a set of reference system measurements based on an initial firmware imag...