INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "FAILURE MODE-ADAPTIVE LOW-DENSITY PARITY CHECK SOFT DECODING"

GENEVA, Feb. 11 -- MICRON TECHNOLOGY, INC. (8000 South Federal Way, Post Office Box 6Boise, Idaho 83707-0006) filed a patent application (PCT/US2025/038057) for "FAILURE MODE-ADAPTIVE LOW-DENSITY PARITY CHECK SOFT DECODING" on Jul 17, 2025. With publication no. WO/2026/029994, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHANG, Li-Te (4120 Barrymore DriveSan Jose, California 95117), XIE, Tingjun (236 Casper StreetMilpitas, California 95035), LANG, Murong (1381 Bing DriveSan Jose, California 95129)

Abstract: In some im...