INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "ADAPTIVE PROGRAM VERIFY SCHEME WITH SENSITIVE VERIFY FOR DEFECT DETECTION"

GENEVA, Jan. 7 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716) filed a patent application (PCT/US2025/035536) for "ADAPTIVE PROGRAM VERIFY SCHEME WITH SENSITIVE VERIFY FOR DEFECT DETECTION" on Jun 26, 2025. With publication no. WO/2026/006633, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIEN, Yu-Chung (4188 Watkins WaySan Jose, California 95135), ZHOU, Zhenming (1273 Avenida Las BrisasSan Jose, California 95131)

Abstract: A system includes a memory device and a processing device, operatively cou...