INTERNATIONAL PATENT: MICROFABRICA INC. FILES APPLICATION FOR "METHOD FOR MAKING IMPROVED BUCKLING BEAM PROBE ARRAYS INCLUDING FORMING PROBES WITH LATERAL POSITIONS MATCHING GUIDE PLATE HOLE POSITIONS"

GENEVA, Feb. 18 -- MICROFABRICA INC. (7911 Haskell AvenueVan Nuys, California 91406) filed a patent application (PCT/US2023/071709) for "METHOD FOR MAKING IMPROVED BUCKLING BEAM PROBE ARRAYS INCLUDING FORMING PROBES WITH LATERAL POSITIONS MATCHING GUIDE PLATE HOLE POSITIONS" on Aug 04, 2023. With publication no. WO/2025/034230, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LOCKARD, Michael S. (15152 Bluffton DriveLake Elizabeth, California 93523), FELICI, Stefano (Via Isonzo 20H23899 Robbiate), FRODIS, Uri (811 Capitan ...