INTERNATIONAL PATENT: MICROCHIP TECHNOLOGY INCORPORATED FILES APPLICATION FOR "APPARATUS AND METHOD FOR FAULT DETECTION IN A DUAL CORE LOCKSTEP MICROCONTROLLER"

GENEVA, Nov. 5 -- MICROCHIP TECHNOLOGY INCORPORATED (2355 West Chandler BoulevardChandler, Arizona 85224) filed a patent application (PCT/US2025/025935) for "APPARATUS AND METHOD FOR FAULT DETECTION IN A DUAL CORE LOCKSTEP MICROCONTROLLER" on Apr 23, 2025. With publication no. WO/2025/226795, the details related to the patent application was published on Oct 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RENNO, Erik Knutsen (Lidarende 11050 Trondheim), KIRKHOLT, Kjetil (Vollahaugen 1077316 Lensvik), SCHANKE, Asgeir (Kolbuvegen 11c1041 Hegra)

Abstract: A method for fault detection in a ...