INTERNATIONAL PATENT: MICRO-EPSILON-MESSTECHNIK GMBH & CO. K.G. FILES APPLICATION FOR "MEASURING SYSTEM AND METHOD FOR MEASURING THE THICKNESS OF FLAT OBJECTS"

GENEVA, July 8 -- MICRO-EPSILON-MESSTECHNIK GMBH & CO. K.G. (Konigbacher StraBe 1594496 Ortenburg) filed a patent application (PCT/DE2024/200136) for "MEASURING SYSTEM AND METHOD FOR MEASURING THE THICKNESS OF FLAT OBJECTS" on Oct 29, 2024. With publication no. WO/2025/140760, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SEIKOWSKY, Axel (Ledererfeld 2194496 Ortenburg), REINDL, Norbert (Voglarn 2794081 Furstenzell), SCHMOIGL, Christoph (VornholzstraBe 10194036 Passau)

Abstract: With regard to particularly reliable me...