INTERNATIONAL PATENT: META PLATFORMS TECHNOLOGIES, LLC FILES APPLICATION FOR "TWO WAVELENGTH MEMS SCANNING SELF-MIXING INTERFEROMETRY FOR EYE TRACKING"

GENEVA, June 18 -- META PLATFORMS TECHNOLOGIES, LLC (1 Meta WayMenlo Park, California 94025) filed a patent application (PCT/US2024/055284) for "TWO WAVELENGTH MEMS SCANNING SELF-MIXING INTERFEROMETRY FOR EYE TRACKING" on Nov 09, 2024. With publication no. WO/2025/122294, the details related to the patent application was published on Jun 12, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): AIELLO, Gaetano (1 Meta WayMenlo Park, California 94025), WANG, Youmin (1 Meta WayMenlo Park, California 94025), VADIEE, Ehsan (1 Meta WayMenlo Park, California 94025), QIAN, Ruobing (1 Meta WayMenlo Park, ...