INTERNATIONAL PATENT: META PLATFORMS TECHNOLOGIES, LLC FILES APPLICATION FOR "APPARATUS, SYSTEM AND METHOD FOR EFFICIENTLY TESTING DEVICE RADIATION FOR SPURIOUS EMISSIONS"

GENEVA, Aug. 19 -- META PLATFORMS TECHNOLOGIES, LLC (1 Meta WayMenlo Park, CA 94025) filed a patent application (PCT/US2024/056154) for "APPARATUS, SYSTEM, AND METHOD FOR EFFICIENTLY TESTING DEVICE RADIATION FOR SPURIOUS EMISSIONS" on Nov 15, 2024. With publication no. WO/2025/170658, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): OZTURK, Alkan (1 Meta WayMenlo Park, CA 94025), LIU, Yuqi (1 Meta WayMenlo Park, CA 94025), XUE, Jianqi (1 Meta WayMenlo Park, CA 94025), ZHANG, Jie (1 Meta WayMenlo Park, CA 94025)

Abstract: ...