INTERNATIONAL PATENT: MESO SCALE TECHNOLOGIES, LLC. FILES APPLICATION FOR "METHODS AND KITS FOR MEASURING THREE OR MORE TAU EPITOPES"

GENEVA, Dec. 24 -- MESO SCALE TECHNOLOGIES, LLC. (1601 Research BoulevardRockville, Maryland 20850) filed a patent application (PCT/US2025/033639) for "METHODS AND KITS FOR MEASURING THREE OR MORE TAU EPITOPES" on Jun 13, 2025. With publication no. WO/2025/260043, the details related to the patent application was published on Dec 18, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KENTEN, John H. (401 12th Street S.Arlington, Virginia 22203), SIGAL, George (5333 Trailway DriveRockville, Maryland 20853), NIKOLENKO, Galina (24228 Preakness DriveDamascus, Maryland 20872), CONNELLY, Ryan (800 Am...