INTERNATIONAL PATENT: MERCK PATENT GMBH FILES APPLICATION FOR "SIEVE FOR A PARTICLE MONITORING SYSTEM, SAMPLING LID ASSEMBLY FOR A PARTICLE MONITORING SYSTEM, PARTICLE MONITORING SYSTEM AND AIR SAMPLING METHOD"

GENEVA, Jan. 5 -- MERCK PATENT GMBH (Frankfurter Strasse 25064293 Darmstadt) filed a patent application (PCT/EP2025/067868) for "SIEVE FOR A PARTICLE MONITORING SYSTEM, SAMPLING LID ASSEMBLY FOR A PARTICLE MONITORING SYSTEM, PARTICLE MONITORING SYSTEM AND AIR SAMPLING METHOD" on Jun 25, 2025. With publication no. WO/2026/003054, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CONTASSOT, David (c/o Millipore S.A.S.39 Route Industrielle de la Hardt67120 Molsheim), ARRAULT, Mathieu (c/o Millipore S.A.S.39 Route Industrielle ...