INTERNATIONAL PATENT: MERCK PATENT GMBH FILES APPLICATION FOR "SAMPLING LID FOR PARTICLE MONITORING SYSTEM AND PARTICLE MONITORING SYSTEM COMPRISING SUCH SAMPLING LID"

GENEVA, March 31 -- MERCK PATENT GMBH (Frankfurter Strasse 25064293 Darmstadt) filed a patent application (PCT/EP2024/076020) for "SAMPLING LID FOR PARTICLE MONITORING SYSTEM AND PARTICLE MONITORING SYSTEM COMPRISING SUCH SAMPLING LID" on Sep 18, 2024. With publication no. WO/2025/061725, the details related to the patent application was published on Mar 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CONTASSOT, David (c/o Millipore S.A.S.39, Route Industrielle de la Hardt67120 MOLSHEIM), ARRAULT, Mathieu (c/o Millipore S.A.S.39, Route Industrielle de la Hardt67120 MOLSHEIM), OBLINGER, F...