INTERNATIONAL PATENT: MEDIATEK INC. FILES APPLICATION FOR "METHODS AND APPARATUS OF MEASUREMENT OVERHEAD AND MEASUREMENT GAP REDUCTION WITH AI/ML PREDICTION"

GENEVA, Oct. 3 -- MEDIATEK INC. (No. 1, Dusing 1st Rd., Hsinchu Science ParkHsinchu City, Taiwan 30078) filed a patent application (PCT/CN2024/084423) for "METHODS AND APPARATUS OF MEASUREMENT OVERHEAD AND MEASUREMENT GAP REDUCTION WITH AI/ML PREDICTION" on Mar 28, 2024. With publication no. WO/2025/199869, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIU, Ta-Yuan (No. 1, Dusing 1st Rd., Hsinchu Science ParkHsinchu City, Taiwan 30078), JOHANSSON, Per Johan Mikael (No.1, Fusionopolis Walk, #03-01Solaris 138628), PENG, Y...