GENEVA, July 19 -- MEASURE-IPR APS (c/o bygning 108Frederiksborgvej 399Himmelev4000 Roskilde) filed a patent application (PCT/EP2025/050286) for "DOPPLER EFFECT BASED DEFLECTOMETRY SYSTEM AND METHOD USING MULTIPLE REFERENCE SENSORS" on Jan 08, 2025. With publication no. WO/2025/149499, the details related to the patent application was published on Jul 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SLOTH JENSEN, Kare (c/o bygning 108Frederiksborgvej 399Himmelev4000 Roskilde), HOI, Lasse (c/o bygning 108Frederiksborgvej 399Himmelev4000 Roskilde)

Abstract: A system and method for measur...