INTERNATIONAL PATENT: MATSING, INC. FILES APPLICATION FOR "RAPID SEQUENTIAL AREA SCANNING WITH REDUCED BEAM INTERFERENCE"

GENEVA, July 30 -- MATSING, INC. (12 MauchlyUnit OIrvine, CA 92618) filed a patent application (PCT/US2025/011982) for "RAPID SEQUENTIAL AREA SCANNING WITH REDUCED BEAM INTERFERENCE" on Jan 17, 2025. With publication no. WO/2025/155790, the details related to the patent application was published on Jul 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MATITSINE, Serguei (2619 McKinney AvenueDallas, Texas 75204), MATYTSINE, Leonid (12 MauchlyUnit OIrvine, California 92618), BRAITHWAITE, Richard (Orange, California), WILSON, John (525 Calle Del RitoSan Clemente, California 92672), DEMARCO, A...