INTERNATIONAL PATENT: MASSACHUSETTS INSTITUTE OF TECHNOLOGY FILES APPLICATION FOR "BAYESIAN ESTIMATORS AND EXPECTATION MAXIMIZATION FOR CLASSIFIER TESTING FROM NOISY LABELS"

GENEVA, Sept. 10 -- MASSACHUSETTS INSTITUTE OF TECHNOLOGY (77 Massachusetts AvenueCambridge, MA 02139) filed a patent application (PCT/US2024/046762) for "BAYESIAN ESTIMATORS AND EXPECTATION MAXIMIZATION FOR CLASSIFIER TESTING FROM NOISY LABELS" on Sep 13, 2024. With publication no. WO/2025/183737, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SU, Jonathan (97 Ronald RoadArlington, MA 02474)

Abstract: Methods and systems for evaluating performance of classifier models trained on noisy labels. Using predicted labels f...