GENEVA, May 27 -- MALVERN PANALYTICAL B.V. (Lelyweg 17602 EA Almelo) filed a patent application (PCT/EP2024/082625) for "X-RAY ANALYSIS APPARATUS" on Nov 15, 2024. With publication no. WO/2025/104330, the details related to the patent application was published on May 22, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GORTEMAKER, Christopher (7600 Almelo), VAN SLOTEN, Robin (7600 Almelo)
Abstract:
The present invention relates to an X-ray analysis apparatus comprising a first roller having a length, a second roller, the first roller and the second roller forming a sample plane along which...