GENEVA, May 27 -- MALVERN PANALYTICAL B.V. (Lelyweg 17602 EA Almelo) filed a patent application (PCT/EP2024/082612) for "THIN FILM X-RAY ANALYSIS APPARATUS" on Nov 15, 2024. With publication no. WO/2025/104323, the details related to the patent application was published on May 22, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GORTEMAKER, Christopher (7600 Almelo)
Abstract:
The present invention relates to a thin film X-ray analysis apparatus for analysing a sample. The apparatus comprises a first roller and a second roller which form a film plane along which a film passes. The apparatus...