INTERNATIONAL PATENT: MALVERN PANALYTICAL B.V FILES APPLICATION FOR "ITERATIVELY CALCULATED COMPLEMENTARY BACKGROUND FITTING"

GENEVA, Oct. 18 -- MALVERN PANALYTICAL B.V (Lelyweg 17602 EA Almelo) filed a patent application (PCT/EP2025/059179) for "ITERATIVELY CALCULATED COMPLEMENTARY BACKGROUND FITTING" on Apr 03, 2025. With publication no. WO/2025/214878, the details related to the patent application was published on Oct 16, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHARALAMPOS, Zarkadas (7602 EA7602 EA Almelo Almelo)

Abstract: There is provided a method of analysis of detected X-ray spectra in an instrument, comprising applying a first iteration of a first background algorithm to the detected X-ray spectrum...