INTERNATIONAL PATENT: LUMINA INSTRUMENTS INC. FILES APPLICATION FOR "DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFECT SCANNER AND OPTICAL INSPECTOR"

GENEVA, June 12 -- LUMINA INSTRUMENTS INC. (2109 O'Toole Avenue, Suite PSan Jose, California 95131) filed a patent application (PCT/US2024/057486) for "DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFECT SCANNER AND OPTICAL INSPECTOR" on Nov 26, 2024. With publication no. WO/2025/117560, the details related to the patent application was published on Jun 05, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MEEKS, Steven W. (719 Christine DrivePalo Alto, California 94303), NGUYEN, Hung Phi (1045 Garrigy WaySanta Clara, California 95054), MOGHADDAM, Alireza Shahdoost (1370 Corte...